THz Imaging with < 250 µm Resolution

ǀ  TOPTICA Tuesday

TOPTICA demonstrates terahertz reflection imaging with submillimeter resolution.

Even the finest structures of a metallic resolution test pattern – metal stripes of only 250 µm width, and stripe separations of 500 µm and 250 µm – are clearly resolved. The image was acquired with TOPTICA’s TeraFlash pro and its Imaging Extension. In order to visualize the smallest features, a frequency filter from 3.0 – 3.8 THz was applied, so that only the highest frequencies contribute to the image – a possibility that opens up thanks to the broad bandwidth and a very high dynamic range of the TeraFlash pro.