TeraFlash smart Ultrafast time-domain terahertz platform

The TeraFlash smart is TOPTICA’s ultrafast time-domain terahertz spectroscopy platform, purpose-built for high-speed industrial and scientific applications. Based on TOPTICA’s proprietary ECOPS technology (Electronically Controlled Optical Sampling), it employs two synchronized femtosecond lasers and completely eliminates the need for a mechanical delay line. This innovative design ensures robust operation, minimal maintenance, and reliable performance even under adverse ambient conditions.

Thanks to this architecture, the TeraFlash smart achieves measurement speeds of up to 1,600 complete terahertz waveforms per second, while maintaining a wide bandwidth and a high dynamic range . Such ultrafast data acquisition makes it uniquely suited for non-contact thickness gauging, resolving layer thicknesses down to the micrometer regime. Another application scenario is quality control on rapidly moving samples, from conveyor belts to polymer extrusion lines and papermaking machines, where conventional THz systems cannot keep pace.

Combining compact design, fiber-coupled flexibility, and industry-leading speed, the TeraFlash smart redefines what is possible in terahertz inspection and analysis. It offers customers a reliable, future-ready platform for real-time process monitoring and advanced material research.

Your Benefits

Record speed
Extremely fast terahertz time-domain measurements at an unprecedented speed of 1600 waveforms per second. The short measurements improve stability and reproducibility, especially when the sample or the setup is exposed to environmental drifts. The system thus lends itself to measurements on rapidly moving samples, e.g. conveyor belts, papermaking machines, or extrusion lines. It enables fastest commercial THz thickness gauging, or imaging with wideband spectral information. 
Take a deep look
TeraFlash smart achieves wide scan range at high speed: typical probing depth 10 to 100 mm. The temporal scan range is up to 700 ps (penetration depth ~ 1-10 cm in plastics). With this even thick samples, or “web” materials that move up and down, can be measured with high data rates. A significant advantage for non-destructive testing and THz imaging. 
Industrial robustness
All-electronic delay, all-fiber design using two synchronized lasers eliminates the need for a mechanical delay line. The proprietary ECOPS technology ensures unprecedented speed by design while delivering ultra-robust and reliable performance even in industrial environments with vibrations and dust. Witness the TeraFlash smart's reduced sensitivity to mechanical perturbations, as the fast sampling “freezes” vibrations. 

Applications

TOPTICA TeraFlash smart - Ultrafast time-domain terahertz platform 0.1 to 4 THz (in < 1 s)
Paint and coating layers
Semicon inspection & metrology
Plastic inspection
Terahertz imaging

Options

Fast imaging extension
Enables imaging at 1600 pixels per second, an industry record for commercial time-domain terahertz systems.
Photoconductive switches
Compact modules for pulsed terahertz generation. With leading-edge InGaAs antennas enabling about 30 µW power and a bandwidth of 6 THz.
Optomechanics
Setups for transmission or reflection measurements. Available for all common beam-path configurations.

Specifications

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Literature

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Application Notes

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