Beyond laser-based systems, several other direct-write lithography technologies are in widespread use, each occupying a distinct niche in the resolution-throughput trade-off space.
Electron-beam lithography (EBL) is the most established alternative, using a focused beam of electrons to expose an electron-sensitive resist directly on the substrate. EBL can write features below 10 nm, but it is limited by an extremely low throughput (hours to expose a single 25 mm² die) and it is a far more complex and expensive to implement.
Focused ion beam (FIB) lithography uses a beam of heavy ions to either sputter material directly or expose a resist, offering sub-10 nm resolution and the unique ability to mill, deposit, and image in a single instrument. Ion implantation damage to the substrate can be a significant concern for active semiconductor devices, limiting this technique to niche applications. In addition, this technique is also limited by its high cost and a throughput even lower than EBL.
Scanning probe lithography (SPL) encompasses a family of techniques including dip-pen nanolithography (DPN), thermal probe lithography, and local oxidation nanolithography (LON) using an AFM tip. These offer exceptional resolution but are inherently serial and extremely low-throughput, suited mainly to research and small-area patterning on flat surfaces.
X-ray proximity lithography and extreme ultraviolet (EUV) interference lithography are used in specialised research contexts for high-resolution periodic nanostructures, but require synchrotron or plasma-based sources, complex vacuum infrastructure, and purpose-made masks or optical elements.