iBeam smart PT Pigtailed, single mode diode laser for OEM

Laser-based metrology and inspection have become indispensable tools for shrinking feature sizes, more and thinner layers, as well as increasing chip and package areas. 

Nitrogen-Vacancy (NV) and Silicon-Vacancy (SiV) centers are two prominent types of color centers (optically active point defects) in diamond, widely studied for their potential in quantum technologies such as sensing, metrology, and computing. They offer complementary properties for different applications.

In confocal microscopy (LSCM), tightly focused laser beams scan biological specimens point by point, generating high-contrast optical sections with exceptional spatial resolution. Our stable, low-noise laser sources with direct modulation of all wavelengths ensure optimal excitation efficiency, no optical cross-talking and minimal photobleaching — key for long-term imaging in live-cell studies.

As semiconductor devices approach atomic-scale dimensions, controlling and verifying every nanometer of pattern geometry becomes a decisive factor for yield and performance. Traditional inspection tools like electron microscopy deliver high resolution, but they are too slow, too localized, and often destructive for in-line process control. Optical Scatterometry, also known as Optical Critical Dimension (OCD) metrology, provides the essential bridge between high-resolution analysis and high-throughput manufacturing. By analyzing how laser light is scattered, diffracted, or reflected from micro- and nanostructures, OCD enables non-contact, rapid, and precise measurement of line width, height, sidewall angle, and layer thickness — with sub-nanometer accuracy.

In modern semiconductor manufacturing, the precise control of thin films defines the success of every process step. Whether it’s the oxide thickness in a gate stack, the refractive index of a dielectric layer, or the uniformity of a multilayer coating — each nanometer matters. Ellipsometry has therefore become one of the most powerful and indispensable tools for non-destructive, high-precision metrology in the semiconductor industry. It provides detailed information about film thickness, optical constants, composition, and interface quality — all from the way polarized light interacts with a surface.

Modern biophotonics goes far beyond conventional fluorescence or confocal microscopy. Researchers today explore living systems through light-matter interactions that reveal chemical composition, molecular dynamics, mechanics, and function. All without labels or stains.