波長計

ハイフィネス社レーザー測定機器

  • 測定精度: 最高 ± 2 MHz
  • 測定波長域: UV - IR (192 nm - 11 um)
  • パルス、CW光測定可能
  • nWレベルからの測定感度
  • 最大 600 Hzで測定データ取込可能

WSシリーズ波長計は高精度での波長測定が可能です。狭バンド幅出射のCW & パルスレーザーが両方とも測定でき波長モニタリング、或いは波長フィードバック制御にも使用可能です。WSシリーズは豊富なライナップをご用意しており紫外から赤外領域 (192 nm -11 um)の広い波長域をカバーします。可動部品の無い堅牢なフィゾー干渉計をベースとした基本構造により寿命はほぼ無制限にご利用頂く事が可能です*1。波長計以外にもスペクトラムアナライザシリーズのLSAとHDSAはCW & パルスレーザー、ガス放電管、スーパールミネッセンスダイオード、半導体レーザー、またLEDのようなマルチライン或いはブロードなスペクトルを持つ光源の測定に最適です。

*1 : 参照用光源などの消耗部品を除きます。

  • Wavelength Meters
  • Technical Information

      WS5WS6-600WS6-200WS7-60WS8-30WS8-10WS8-2
    Measurement rangeUV-II (192 – 800 nm)   
    UV-I (248 – 1180 nm) 
    Standard (330 – 1180 nm)
    VIS / IR-I
    (330 – 1750 nm) 17)
        
    IR-I (630 – 1750 nm)    22) 
    VIS / IR-II
    (500 – 2250 nm)17)
        
    IR-II (1000 – 2250 nm)    20)  
    IR-III (1400 – 11000 nm)     
    Absolute accuracy 1)192 – 330 nm 2)3 pm0.6 pm0.4 pm0.2 pm0.1 pm0.1 pm 
    330 – 420 nm2 pm0.3 pm0.2 pm0.04 pm0.02 pm0.01 pm0.01 pm
    420 – 1100 nm3000 MHz600 MHz200 MHz60 MHz30 MHz10 3)2 4)
    1100 – 2250 nm2000 MHz400 MHz150 MHz40 MHz20 MHz10 3) 
    1400 – 11000 nm3000 MHz 200 MHz    
    Quick coupling accuracy
    (with multi mode fiber)
    3000 MHz600 MHz600 MHz 5) 150 MHz100 MHz100 MHz100 MHz
    Wavelength deviation sensitivity/Measurement resolution 6)500 MHz20 MHz4 MHz 21)2 MHz1 MHz0.4 MHz0.2 MHz 19)
    Linewidth optionEstimation accuracy 7)2000 MHz500 MHz400 MHz200 MHz100 MHz100 MHz100 MHz
    Measurement speed (Hz)950
    (IR: 1500,
    IR-III: 100)
    950
    (IR: 1500) 8)
     
    500
    (IR: 1500,
    IR-III: 100) 8)
    500

     
    500

     
    500

     
    500

     
    Required inputenergy
    and power 9)
    Standard (VIS)0.02 – 15 μJ0.02 – 15  μJ0.02 – 15 μJ0.02 – 15 μJ0.08 - 60 μJ0.08 - 60 μJ0.08 - 60 μJ
    UV-I0.02 – 10 μJ0.02 – 10 μJ0.02 – 10 μJ0.02 – 10 μJ0.02 – 40 μJ  
    UV-II0.02 – 200 μJ0.02 – 200 μJ0.02 – 200 μJ0.02 – 400 μJ   
    IR-I2 – 200 μJ2 – 200 μJ2 – 200 μJ2 – 200 μJ2 – 800 μJ2 – 800 μJ 
    IR-II 10)2 – 80 μJ2 – 80 μJ2 – 80 μJ2 – 80 μJ2 – 800 μJ  
    IR-III1 mW 1 mW μJ    
    FSR of the Fizeau interferometers
    (Fine/wide mode) 11)
    100 GHz16/100 GHz 12)16/100 GHz 13)8/32 GHz4/32 GHz2/20 GHz2/20 GHz
    Calibration 18)Built-in calibration 14) Built-in calibration 15)Stabilized HeNe laser or any other well known lasersource Δν < 5 MHzSLR-780 or any other well known laser sourceΔν
    < 2 MHz
    I2 stabilized HeNe or any well knownlaser sourceΔν
    < 1 MHz
    Recommended calibration period≤ 1 month≤ 14 days≤ 10 hours≤ 1 hour≤ 2 minutes
    Warm-up timeNo warm-up time under constant ambient conditions 16) > 30 minutes
    Dimensions L × W × H mm³360 × 120 × 120360 × 120 × 120360 × 200 × 120360 × 200 × 120360 × 200 × 120360 × 200 × 120360 × 200 × 120
    Weight2.8 kg2.8 kg5.5 kg 18)5.9 kg6.1 kg6.4 kg6.4 kg
    InterfaceHigh-speed USB 2.0 connection
    Power supplyPower consumption < 2.3 W, power provided directly via USB cable
    IR-II, IR-III: external power supply included;
    WS7-60 IR-I, WS8-30 IR-I, WS8-10 IR-I: external power supply included

    1) According to 3σ criterion, but never betterthan 20 % of the laser linewidth.
    2) With multimode fiber.
    3) ± 200 nm around calibration wavelength; outside of this range the accuracy is 30 MHz.
    4) ± 2 nm around calibration wavelength; outside of thisrange the accuracy is 10 MHz; note 3 also applies.
    5) 200 MHz for WS6-200 IR-III.
    6) Standard deviation. WS6-200 and higher modelsrequire singlemode or photonic cr ystal fibers to reachthis resolution.
    7) Not better than 20 % of the linewidth.
    8) Depending on PC hardware and settings. Highspeedmodels up to 76 kHz available.
    9) The CW power interpretation in [μW] compares to anexposure of 1s (generally the energy needs to be dividedby the exposure time to obtain the required power).
    10) μJ interpretation for pulsed lasers. CW signals needmore power in [μW] since the exposure is limited atIR-II instruments.
    11) Each instrument in each mode can measure lasers witha linewidth up to 30 % of the correspondig FSR.
    12) For IR instruments: 32/32.
    13) For IR-I and IR-II instruments: 16/16,for IR-III instruments: 8/80.
    14) IR-III: external calibration source needed, e.g. SLR-1532.
    15) IR instruments: external calibration source needed,e.g. SLR-1532.
    16) IR-II: > 30 min. warm-up, or until ambient equilibrium.
    17) These instruments have a decreased sensitivity by afactor of 4, compared to the Standard and IR ranges in the required input fields, respectively.
    18) 2.8 for IR-I and IR-II.
    19) 100 kHz for special ranges on request.
    20) Photonic cr ystal switches can be used up to 2000 nm.Please contact HighFinesse if you want to measureover 2000 nm.
    21) IR-III: 20 MHz.
    22) Measurement range WS7-60 IR-I: 530 – 1750 nm.

     

  • Options

    MultiChannel option for simultaneous measurement of several lasers.

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