HighFinesse Wavelength Meters
- Unmatched absolute accuracy down to 2 MHz
- Measurement ranges from UV to IR (192 nm .. 11 µm)
- For pulsed and cw lasers
- Sensitivity down to nW light power
- Up to 300 Hz acquisition speed
The wavelength meters of the WS series accomplish wavelength measurements with highest accuracy. Both cw and pulsed lasers with narrow-band emission can be examined, monitored and even actively controlled. Various models of the WS series are available, covering UV to IR wavelength ranges (192 nm - 11 µm). Based on a rugged Fizeau interferometer setup without any moving components, the wavelength meters provide quasi unlimited lifetime.
Technical Information
Technical Information
| LSA | WS5 | WS6- 600 | WS6- 200 | WS7 | WSU- 30 | WSU- 10 | WSU- 2 | |||
|---|---|---|---|---|---|---|---|---|---|---|
| Measurement range | Standard | 350 - 1120 nm | • | • | • | • | • | • | • | • |
| UV | 248 - 1100 nm | • | • | • | • | • | • | • | • | |
| UV-II | 192 - 800 nm | • | • | • | • | |||||
| UV-II-VIS | 192 - 1190 nm | • | ||||||||
| VIS- IR | 400 - 1750 nm | • | • | • | ||||||
| IR | 800 - 1750 nm | • | • | • | • | • | • | • | ||
| IR-II | 1000 - 2250 nm | • | • | • | • | |||||
| IR - III | 2 - 11µm | • | • | • | ||||||
| Absolute accuracy | 192 - 370 nm [pm] | 6 | 3 | 0.6 | 0.4 | 0.2 | 0.1 | 0.1 | 0.1 | |
| 370 - 1100 nm [MHz] | 6000 | 3000 | 600 | 200 | 60 | 30 | 101) | 22) | ||
| 1100 - 2250 nm [MHz] | 12000 | 2000 | 400 | 150 | 40 | 20 | 101) | |||
| 2 - 11µm [MHz] | 1-5nm3) | 2000 | 200 | |||||||
| Calibration | Built-in4) | Built-in4) | Built-in | Built-in4) | Built-in | External | External | External |
1) ± 200 nm around calibration wavelength
2) ± 2 nm around calibration wavelength
3) depending on device type
4) except IR-III
Operation principle
HighFinesse Fizeau interferometer setup of WS series
Contrary to Michelson interferometer based instruments, our wavelength meter uses fixed Fizeau interferometers to detect the wavelength of a laser beam.
The beam enters the optical unit via a fiber, is collimated by a lens and then split into several beams. Each beam passes a Fizeau interferometer of specific length to generate distinct interferometric patterns. All these patterns are recorded by a CCD array and digitally transferred via USB interface to the operator’s PC. The firmware finally analyses the data and calculates the laser wavelength, taking into account the ambient temperature.
Due to the Fizeau interferometer setup, pulsed lasers can be measured at high measurement rate. The rugged setup also enables usage under extreme conditions (e.g. in airplanes with significant vibration). For more detailed technical information click here.
Options & Related Products
Options & Related Products
MultiChannel - Simultaneous measurement of 2, 4, or 8 lasers
PID control - Locks your laser to any wavelength or tunes it along arbitrary functions. Can be combined with MultiChannel option
Linewidth option - Calculates the laser linewidth using the interferogram data
Diffraction grating - For spectral analysis of broad linewidth lasers
TTL - For synchronization of experiment and measurement
Please follow the link to learn more about the large variety of options!
MultiChannel option for simultaneous measurement of several lasers.
Technical Drawings
Applications
Applications
- Laser Measurement
- Laser Control
- LIDAR
Download
Download
HighFinesse_Product_Brochure_2013.pdf
